Westboro Photonics

Uniformity Spots Software Package

Fast Uniformity Analysis for Any Display, Emissive Source, or Illuminated Surface

Luminance and chromaticity uniformity are two of the most important characteristics of displays, backlights, and other emissive sources and illuminated surfaces.

Uniformity is typically measured using a fixed grid of test locations in the display area. As a Uniformity Spots Package user, follow a simplified process to:

  • Define simple or complex area of interest (AOI) arrays;
  • Automatically apply previously created AOIs to measurements; and
  • Compute uniformity metrics

The software re-registers the AOI array for each measurement, making highly accurate fixturing unnecessary. Both rectangular and irregularly-shaped sources are supported.

9 Spot

Key Features

  • Assess the uniformity of one or more sources at a time
  • Generate user-defined pattern of AOIs
  • Highlight the locations of minimum and maximum luminance
  • Evaluate metrics such as per cent uniformity
  • DFF spot scan uniformity
  • Fast test times
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