Fast Uniformity Analysis for Any Display, Emissive Source, or Illuminated Surface

Luminance and chromaticity uniformity are two of the most important characteristics of displays, backlights, and other emissive sources and illuminated surfaces.

Uniformity is typically measured using a fixed grid of test locations in the display area. As a Uniformity Spots Package user, follow a simplified process to:

• Define simple or complex area of interest (AOI) arrays;
• Automatically apply previously created AOIs to measurements; and
• Compute uniformity metrics

The software re-registers the AOI array for each measurement, making highly accurate fixturing unnecessary. Both rectangular and irregularly-shaped sources are supported.