Uniformity Spots Package

Fast Uniformity Analysis for any Display

Luminance and chromaticity uniformity are two of the most important characteristics of displays and backlights. Uniformity is typically measured using a fixed grid of test locations in the display area.

The Uniformity Spots package allows users to follow a simplified process to:

  • define simple or very complex area of interest (AOI) arrays;
  • automatically apply the AOIs to measurements, and
  • compute uniformity metrics

The software re-registers the AOI array for each measurement, making highly accurate fixturing unnecessary, and both rectangular and irregularly-shaped displays are supported.

Key Features

  • Analyze one or more displays at a time
  • Generation of user-defined pattern of AOIs
  • Highlight the locations of minimum and maximum luminance
  • Evaluations including percent uniformity
  • DFF spot scan uniformity
  • Fast test times
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